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A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy

Review of Scientific Instruments · 1993 · Vol. 64(2) · pp. 403–405
J. P. ClevelandS. ManneDan BocekPaul K. Hansma

Abstract

The spring constant of microfabricated cantilevers used in scanning force microscopy (SFM) can be determined by measuring their resonant frequencies before and after adding small end masses. These masses adhere naturally and can be easily removed before using the cantilever for SFM, making the method nondestructive. The observed variability in spring constant—almost an order of magnitude for a single type of cantilever—necessitates calibration of individual cantilevers in work where precise knowledge of forces is required. Measurements also revealed that the spring constant scales with the cube of the unloaded resonant frequency, providing a simple way to estimate the spring constant for less precise work.

Force Microscopy Techniques and ApplicationsMechanical and Optical ResonatorsIntegrated Circuits and Semiconductor Failure AnalysisCantileverSpring (device)Constant (computer programming)CalibrationMaterials scienceWork (physics)AcousticsPhysicsComposite materialComputer science
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References
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Applied Physics Letters · 1988 · 1,265 citations
Atomic Resolution with Atomic Force Microscope
Europhysics Letters (EPL) · 1987 · 546 citations
Atomic Force Microscope
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A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy · Scinovex