Advanced Materials Characterization Techniques

This cluster of papers focuses on the advancements in atom probe tomography, a technique for three-dimensional nanoscale characterization of materials. The research covers topics such as specimen preparation, field evaporation behavior, spatial resolution, crystallographic mapping, and the application of correlative microscopy in materials science.

Journals publishing in this area

1

Surface Science

ISSN 0039-60282,162 articles in this topic

268h-index

1.87Impact

39.5KArticles

1.1MCitations

2

Acta Materialia

ISSN 1359-6454930 articles in this topic

409h-index

8.08Impact

21.2KArticles

1.6MCitations

3

Scripta Materialia

ISSN 1359-6462663 articles in this topic

253h-index

4.65Impact

16.4KArticles

691.7KCitations

4

Acta Metallurgica

Acta Metallurgica

ISSN 0001-6160483 articles in this topic

286h-index

7.5KArticles

511.4KCitations