Surface Roughness and Optical Measurements

This cluster of papers focuses on the characterization and measurement of surface roughness in optical components, utilizing techniques such as fractal analysis, machine vision, scattering theory, and thin film analysis. The research covers topics such as surface roughness measurement, power spectral density analysis, micromorphology characterization, and the application of image processing for evaluating surface roughness.

Journals publishing in this area

1

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

ISSN 0277-786X11,056 articles in this topic

234h-index

436.5KArticles

1.9MCitations

2

Applied Optics

ISSN 1539-45222,828 articles in this topic

313h-index

44.6KArticles

1.3MCitations