Radiation Effects in Electronics

This cluster of papers focuses on the challenges and techniques for fault tolerance in electronic systems, particularly in the context of soft errors, radiation effects, and single event upsets in CMOS technology. It explores various methods for error detection, reliability evaluation, and mitigation of transient faults in nanoelectronics.

Journals publishing in this area

1

IEEE Transactions on Nuclear Science

ISSN 0018-94994,873 articles in this topic

181h-index

1.21Impact

32.9KArticles

475KCitations

2

IEEE Transactions on Computers

ISSN 0018-9340708 articles in this topic

259h-index

2.90Impact

14.5KArticles

480.4KCitations

3

Physics in Medicine and Biology

ISSN 0031-9155416 articles in this topic

262h-index

2.46Impact

18.9KArticles

674KCitations