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Physical Sciences → Computer Science → Computer Vision and Pattern Recognition

Optical measurement and interference techniques

This cluster of papers covers advances in digital image correlation techniques, including camera calibration, structured light and fringe projection methods, 3D shape measurement, phase unwrapping, strain and deformation analysis, optical metrology, and inverse modeling for surface profilometry.

71.7K works worldwide738.8K citations
Camera CalibrationStructured LightFringe Projection3D Shape MeasurementPhase UnwrappingStrain MeasurementDeformation AnalysisOptical MetrologyInverse ModelingSurface Profilometry

Journals publishing in this area

1Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE cover
234h-index
2Applied Optics cover
Applied Optics
ISSN 1539-45224,069 articles in this topic
313h-index
3Optics Express cover
Optics Express
ISSN 1094-40872,590 articles in this topic
339h-index
4Optics Communications cover
Optics Communications
ISSN 0030-40181,808 articles in this topic
189h-index
5IEEE Transactions on Instrumentation and Measurement cover
IEEE Transactions on Instrumentation and Measurement
ISSN 0018-9456756 articles in this topic
195h-index
6IEEE Transactions on Pattern Analysis and Machine Intelligence cover
547h-index
7Mechanical Systems and Signal Processing cover
Mechanical Systems and Signal Processing
ISSN 0888-3270444 articles in this topic
242h-index
8
International Journal of Computer Vision
ISSN 0920-5691306 articles in this topic
287h-index
9ACM Transactions on Graphics cover
ACM Transactions on Graphics
ISSN 0730-0301166 articles in this topic
310h-index