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P

P.E. Dodd

Sandia National Laboratories California

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Publications

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Citations

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Impact (2-yr)

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Top Publications

Basic mechanisms and modeling of single-event upset in digital microelectronics

IEEE Transactions on Nuclear Science20031,105 citationsFirst authorCorresponding

Radiation Effects in MOS Oxides

IEEE Transactions on Nuclear Science2008904 citations

Radiation effects in SOI technologies

IEEE Transactions on Nuclear Science2003430 citations

Current and Future Challenges in Radiation Effects on CMOS Electronics

IEEE Transactions on Nuclear Science2010354 citationsFirst authorCorresponding

Production and propagation of single-event transients in high-speed digital logic ICs

IEEE Transactions on Nuclear Science2004328 citationsFirst authorCorresponding

Challenges in hardening technologies using shallow-trench isolation

IEEE Transactions on Nuclear Science1998244 citations

P.E. Dodd · Scinovex