articleTop 10% cited
Full-speed testing of A/D converters
IEEE Journal of Solid-State Circuits · 1984 · Vol. 19(6) · pp. 820–827
J. Doernberg✉(University of California, Berkeley)H.-S. Lee(Massachusetts Institute of Technology)D.A. Hodges(University of California, Berkeley)
Abstract
Improved computer-aided analog-to-digital converter (ADC) characterization methods based on the code density test and spectral analysis using the fast Fourier transform are described. The code density test produces a histogram of the digital output codes of an ADC sampling a known input. The code density can be interpreted to compute the differential and integral nonlinearities, gain error, offset error, and internal noise. Conversion-rate and frequency-dependent behavior can also be measured.
Analog and Mixed-Signal Circuit DesignAdvancements in PLL and VCO TechnologiesAdvanced Electrical Measurement TechniquesConvertersIntegral nonlinearityComputer scienceAnalog-to-digital converterCode (set theory)Offset (computer science)Fourier transformSuccessive approximation ADCHistogramElectronic engineering
Citations
515
FWCI
3.30
field-weighted impact
References
5
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92%
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References
On the use of windows for harmonic analysis with the discrete Fourier transform
Proceedings of the IEEE · 1978 · 7,122 citations
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