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Essential physics of carrier transport in nanoscale MOSFETs

IEEE Transactions on Electron Devices · 2002 · Vol. 49(1) · pp. 133–141
Mark LundstromZhibin Ren

Abstract

The device physics of nanoscale MOSFETs is explored by numerical simulations of a model transistor. The physics of charge control, source velocity saturation due to thermal injection, and scattering in ultrasmall devices are examined. The results show that the essential physics of nanoscale MOSFETs can be understood in terms of a conceptually simple scattering model.

Semiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit DesignNanowire Synthesis and ApplicationsNanoscopic scaleMOSFETScatteringSaturation velocityTransistorPhysicsVelocity saturationField-effect transistorCharge carrierNanoelectronics
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Cited by
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IEEE Transactions on Electron Devices · 2003 · 769 citations
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