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Thermal conductivity measurement from 30 to 750 K: the 3ω method

Review of Scientific Instruments · 1990 · Vol. 61(2) · pp. 802–808
David G. Cahill

Abstract

An ac technique for measuring the thermal conductivity of dielectric solids between 30 and 750 K is described. This technique, the 3ω method, can be applied to bulk amorphous solids and crystals as well as amorphous films tens of microns thick. Errors from black-body radiation are calculated to be less than 2% even at 1000 K. Data for a-SiO2, Pyrex 7740, and Pyroceram 9606 are compared to results obtained by conventional techniques.

Glass properties and applicationsMaterial Dynamics and PropertiesPhase-change materials and chalcogenidesMaterials scienceAmorphous solidThermal conductivityDielectricThermal conductivity measurementConductivityThermalAnalytical Chemistry (journal)Composite materialOptics

Funding

  • National Science Foundation
  • Semiconductor Research Corporation
Citations
1,849
FWCI
4.06
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20
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94%
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References
Heat flow and lattice vibrations in glasses
Solid State Communications · 1989 · 374 citations
<i>The Art of Electronics</i>
American Journal of Physics · 1990 · 1,496 citations
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